THEORY OF SPIN-LATTICE RELAXATION IN THE TRIPLET STATE OF NAPHTALENE IN DURENEVOLLMANN W.1981; CHEM. PHYS.; ISSN 0301-0104; NLD; DA. 1981; VOL. 57; NO 1-2; PP. 157-166; BIBL. 12 REF.Article

RESOLUTION ENHANCEMENT OF ULTRASONIC B-SCAN IMAGES BY DECONVOLUTIONVOLLMANN W.1982; IEEE TRANS. SONICS ULTRASON.; ISSN 0018-9537; USA; DA. 1982; VOL. 29; NO 2; PP. 78-83; BIBL. 11 REF.Article

THEORETICAL PREDICTIONS ABOUT ENDOR OF BIRADICALS IN LIQUID SOLUTION.VOLLMANN W.1976; MOLEC. PHYS.; G.B.; DA. 1976; VOL. 32; NO 2; PP. 395-406; BIBL. 17 REF.Article

LATERAL INVERSE FILTERING OF ULTRASONIC B-SCAN IMAGESVOLLMANN W; SCHOMBERG H; MAHNKE G et al.1982; ACOUSTICAL IMAGING; ISSN 0270-5117; USA; DA. 1982; VOL. 12; PP. 193-203; BIBL. 7 REF.Conference Paper

LATERAL INVERSE FILTERING OF ULTRASONIC B-SCAN IMAGESSCHOMBERG H; VOLLMANN W; MAHNKE G et al.1983; ULTRASONIC IMAGING; ISSN 0161-7346; USA; DA. 1983; VOL. 5; NO 1; PP. 38-54; BIBL. 14 REF.Article

NUCLEAR SPIN DYNAMICS IN THE PRESENCE OF ELECTRONIC RELAXATION.BOSSE J; GABRIEL H; VOLLMANN W et al.1975; PHYS. STATUS SOLIDI, B; ALLEM.; DA. 1975; VOL. 68; NO 1; PP. 81-91; ABS. ALLEM.; BIBL. 18 REF.Article

Druckabhängigkeit der elektrischen Leitfähigkeit organischer TCNQ-Komplexschichten als Basis für Druck- und KraftsensorenVOLLMANN, W; ADAM, G.Wissenschaftliche Zeitschrift der Technischen Universität Karl-Marx-Stadt/Chemnitz. 1990, Vol 32, Num 1, pp 85-93Article

Spin-lattice relaxation in the triplet state of acridine in fluoreneFUJARA, F; VOLLMANN, W.Chemical physics. 1984, Vol 90, Num 1-2, pp 137-146, issn 0301-0104Article

RADICAL PAIR FORMATION AND DECAY BY PHOTOCHEMICAL HYDROGEN TRANSFER IN DOPED FLUORENE CRYSTALS AS STUDIED BY ESR TRANSIENT MUTATIONFURRER R; FUJARA F; LANGE C et al.1980; CHEM. PHYS. LETT.; ISSN 0009-2614; NLD; DA. 1980; VOL. 76; NO 2; PP. 383-389; BIBL. 8 REF.Article

Druckabhängigkeit der elektrischen Leitfähigkeit organischer TCNQ-Komplexschichten als Basis für Druck- und Kraftsensoren = Pressure dependence of electric conductivity of organic TCNQ complex layers as a base for pressure and power sensorsVOLLMANN, W; ADAM, G.Maschinenbautechnik. 1991, Vol 40, Num 4, pp 177-178, issn 0025-4495, 187 [3 p.]Article

PROPERTIES OF ORIENTED TTF-TCNQ THIN FILMSREINHARDT C; VOLLMANN W; HAMANN C et al.1980; KRIST. TECH.; ISSN 0023-4753; DDR; DA. 1980; VOL. 15; NO 2; PP. 243-251; ABS. GER; BIBL. 10 REF.Article

Electron energy loss measurements on tetracyanoquinodimethane (TCNQ)BURKERT, M; LINK, R; PUHLMANN, N et al.Physica status solidi. B. Basic research. 1988, Vol 145, Num 2, pp K121-K123, issn 0370-1972Article

Spezielle organische Ladungsübertragungskomplex-Dünnschichtsysteme-Herstellung und elektrische Eigenschaften = Complexes à transfert de charge des systèmes de couches minces organiques. Préparation et propriétés électriques = Special organic charge-transfer-complex thin flims ― preparation and electrical propertiesVOLLMANN, W; HAMANN, C; LIBERA, L et al.Wissenschaftliche Zeitschrift der Technischen Hochschule Karl-Marx-Stadt. 1988, Vol 30, Num 1, pp 107-114, issn 0372-7610Article

TRANSIENT ESR NUTATION SIGNALS IN EXCITED AROMATIC TRIPLET STATESFURRER R; FUJARA F; LANGE C et al.1980; CHEM. PHYS. LETT.; ISSN 0009-2614; NLD; DA. 1980; VOL. 75; NO 2; PP. 332-339; BIBL. 15 REF.Article

Relations between the morphology and conductivity of thin films of tetrathiofulvalinium-tetracyanoquinodimethaneVOLLMANN, W; BERGER, W; HAMANN, C et al.Thin solid films. 1984, Vol 111, Num 1, pp 7-16, issn 0040-6090Article

Automatic shimming for localized spectroscopyHOLZ, D; JENSEN, D; PROKSA, R et al.Medical physics (Lancaster). 1988, Vol 15, Num 6, pp 898-903, issn 0094-2405Article

Scanning tunneling microscopy investigations of organic thin film topographyTROYANOVSKIJ, A. M; HIETSCHOLD, M; KHAIKIN, M. S et al.Thin solid films. 1990, Vol 188, Num 2, pp 329-333, issn 0040-6090, 5 p.Article

In vivo ¹H magnetic resonance spectroscopy of rat brain after valproate administrationLEIB, J; BRAUN, J; SCHILLING, A et al.Neuroradiology (Berlin. Print). 2004, Vol 46, Num 5, pp 363-367, issn 0028-3940, 5 p.Article